Testing and Reliable Design of CMOS Circuits

By Niraj K. Jha and Sandip Kundu

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In the last few years CMOS technology has become increas- ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den- sity and... This description may be from another edition of this product.

Format:Paperback

Language:English

ISBN:1461288185

ISBN13:9781461288183

Release Date:September 2011

Publisher:Springer

Length:232 Pages

Weight:0.78 lbs.

Dimensions:0.5" x 6.1" x 9.2"

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Testing and Reliable Design of CMOS Circuits

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